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CEBE OctoberFEST 2013

Electronics Aging

October 10-11, 2013, ICT-507, TUT (Akadeemia tee 15A)


Aging is a phenomenon known to occur today in nanoelectronics and to cause performance degradation and even system failures. CEBE organizes a workshop with invited talks by distinguished experts in this area. The workshop is supported by the Estonian Doctoral School in ICT and the international education network DCPS (ZUSYS) funded by DAAD, Germany.

СEBE October Focus Event on Electronics Aging will take place on October 10-11, 2013 in the ICT Building of the Tallinn University of Technology with the following agenda:

 

Thursday, October 10

Room: ICT-507, Akadeemia tee 15A

9:00 Coffee and Welcome words
9:30-12:00 Doctoral School tutorial
 

"Design of On-Chip Monitors for Reliable SoC-Based Embedded Systems", Fabian Vargas, Catholic University PUCRS, Brazil

12:00-14:00 Lunch break
14:00-16:30 Advanced discussions
  "Aging effect in New Technologies: Investigating 28nm and below", Petr Pfeifer, Zdeněk Plíva, TU Liberec, Czech Republic
  "Permanent Fault Compensation in Processor Cores for Reliability or Lifetime Increase", Tobias Koal, BTU Cottbus, Germany
  "Fault Management for Aging Faults", Artur Jutman, Testonica, Estonia
  "Aging-Critical Paths in Nanoelectronics Logic", Jaan Raik, Maksim Jenihhin, Tallinn University of Technology, Estonia
   

Friday, October 11

Room: ICT-405, Akadeemia tee 15A

10:00-11:30 Doctoral School hands-on lab
  Design of On-Chip Monitors for Reliable SoC-Based Embedded Systems: Experiments in the SPICE Environment, Fabian Vargas, Catholic University PUCRS, Brazil
12:00-13:00 Lunch break
13:00-16:30

Advanced discussions continue in close groups (room: ICT-507)


For more details please contact  Maksim Jenihhin, +372 620 2262, maksim@ati.ttu.ee