4. veebruaril (neljapäev), kell 10:00 peab Arvutitehnika instituudi ruumis IT-209 kutsutud loengu Linköpingi ülikooli post-doc Urban Ingelsson (PhD Southamptoni ülikoolist, prof. Al-Hashimi grupist).
Pealkiri: Investigation into voltage and variation-aware manufacturing test
Recent IC design trends include variation of the supply voltage to implement low power modes and continued device scaling into the deep-submicron where process variation will have a significant impact. To enable high quality testing of ICs in an environment of supply voltage and process variations, the effect of variation on defects such as resistive bridges and full opens must be studied. This talk will discuss the behavior of such defects in the presence of variation and demonstrate effective variation-aware test methods.